Eds analysis laboratories by MicroVision Laboratories? Energy Dispersive X-Ray Spectroscopy (EDS): While in a Scanning Electron Microscope (SEM), samples are exposed to high energy electrons in a vacuum, which generates X-rays through secondary electron transitions. Variations in electron configuration specific to each element generate different energy electrons, and thus different signature energy peaks, indicating which elements are present in the sample. Analysis is performed only on areas which are exposed to the electron beam, facilitating precise control of the analyzed area. This means the composition of very small areas or particles in a sample can be taken. Since EDS is performed in the SEM chamber, a quick and easy interrogation of the surface materials as viewed on the SEM is possible. This can be expanded to include the entire sample, please see our Elemental Mapping page. Additionally, relative amount of the elements present can be calculated, generating composition percentages.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you. Discover additional info on microvision labs.
An affected floor tile was submitted to determine if the previous mold testing had missed a source on the tile backing or mastic. Additionally, a new tile from the same manufacturing lot was submitted for comparison. The process of preparing and examining the sample and reference tile was documented. Areas with darkened surface features were imaged and then cut out and examined. While the dark spots looked very discrete when examined by eye, under top light polarized microscopy they appeared more diffuse at the outer edges. The darkest areas surrounded what appeared to be particles embedded in the surface.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. See more details at here.